Untersuchungen zur Siloxan Filmbildung auf funktionalisierten Germanium Kristallen mittels Rasterkraftmikroskopie (AFM) und ATR-FTIR-Spektroskopie / Investigation of Siloxane Film Formation on Functionalized Germanium Crystals by Atomic Force Microscopy and FTIR-ATR Spectroscopy
| Author(s): |
J. Glowacky
S. Heißler M. Boese H. Leiste T. Koker W. Faubel A. Gerdes H. S. Müller |
|---|---|
| Medium: | journal article |
| Language(s): | English |
| Published in: | Restoration of Buildings and Monuments, December 2008, n. 6, v. 14 |
| Page(s): | 413-424 |
| DOI: | 10.1515/rbm-2008-6251 |
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10531755 - Published on:
17/12/2020 - Last updated on:
19/02/2021
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