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Untersuchungen zur Siloxan Filmbildung auf funktionalisierten Germanium Kristallen mittels Rasterkraftmikroskopie (AFM) und ATR-FTIR-Spektroskopie / Investigation of Siloxane Film Formation on Functionalized Germanium Crystals by Atomic Force Microscopy and FTIR-ATR Spectroscopy

Structurae cannot make the full text of this publication available at this time. The full text can be accessed through the publisher via the DOI: 10.1515/rbm-2008-6251.
  • About this
    data sheet
  • Reference-ID
    10531755
  • Published on:
    17/12/2020
  • Last updated on:
    19/02/2021
 
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