Novel test prototype for the determination of mode I fracture parameters: application to adhesively bonded electronics
Author(s): |
Lassaad Ben Fekih
Olivier Verlinden Christophe De Fruytier Georges Kouroussis |
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Medium: | journal article |
Language(s): | English |
Published in: | Procedia Structural Integrity, 2017, v. 5 |
Page(s): | 5-12 |
DOI: | 10.1016/j.prostr.2017.07.051 |
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10642356 - Published on:
10/01/2022 - Last updated on:
10/01/2022