Advanced Nanoscale Characterization of Cement Based Materials Using X-Ray Synchrotron Radiation: A Review
| Author(s): |
Sejung R. Chae
Juhyuk Moon Seyoon Yoon Sungchul Bae Pierre Levitz Robert Winarski Paulo J. M. Monteiro |
|---|---|
| Medium: | journal article |
| Language(s): | English |
| Published in: | International Journal of Concrete Structures and Materials, May 2013, n. 2, v. 7 |
| Page(s): | 95-110 |
| DOI: | 10.1007/s40069-013-0036-1 |
| Copyright: | © The Author(s) 2013 |
| License: | This creative work has been published under the Creative Commons Attribution 2.0 Generic (CC-BY 2.0) license which allows copying, and redistribution as well as adaptation of the original work provided appropriate credit is given to the original author and the conditions of the license are met. |
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10201569 - Published on:
11/12/2018 - Last updated on:
02/06/2021
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