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The following bibliography contains all publications indexed in this database that are linked with this name as either author, editor or any other kind of contributor.

  1. Zhou, Linyong / Huang, Peizhen / Zhang, Jiaming (2023): Phase field simulation of the inclusion instability and splitting processes in interconnects due to interface diffusion induced by electromigration. In: Journal of Mechanics of Materials and Structures, v. 18, n. 1 (24 March 2023).

    https://doi.org/10.2140/jomms.2023.18.39

  2. Zhou, Linyong / Huang, Peizhen / Cheng, Qiang (2018): Effect of interconnect linewidth on the evolution of intragranular microcracks due to surface diffusion in a gradient stress field and an electric field. In: Journal of Mechanics of Materials and Structures, v. 13, n. 3 (August 2018).

    https://doi.org/10.2140/jomms.2018.13.365

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