Linyong Zhou
- Phase field simulation of the inclusion instability and splitting processes in interconnects due to interface diffusion induced by electromigration. Dans: Journal of Mechanics of Materials and Structures, v. 18, n. 1 (24 mars 2023). (2023):
- Effect of interconnect linewidth on the evolution of intragranular microcracks due to surface diffusion in a gradient stress field and an electric field. Dans: Journal of Mechanics of Materials and Structures, v. 13, n. 3 (août 2018). (2018):