A wireless impedance analyzer for automated tomographic mapping of a nanoengineered sensing skin
| Author(s): |
Sukhoon Pyo
Kenneth J. Loh Tsung-Chin Hou Erik Jarva Jerome P. Lynch |
|---|---|
| Medium: | journal article |
| Language(s): | English |
| Published in: | Smart Structures and Systems, July 2011, n. 1, v. 8 |
| Page(s): | 139-155 |
| DOI: | 10.12989/sss.2011.8.1.139 |
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10666308 - Published on:
27/05/2022 - Last updated on:
27/05/2022
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