A study on crack detection using eigenfrequency test data
Author(s): |
Young-Shin Lee
Myung-Jee Chung |
---|---|
Medium: | journal article |
Language(s): | English |
Published in: | Computers & Structures, June 2000, n. 3, v. 77 |
Page(s): | 327-342 |
DOI: | 10.1016/s0045-7949(99)00194-7 |
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10280482 - Published on:
05/01/2019 - Last updated on:
05/01/2019