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Robust Bad Data Detection Method for Microgrid Using Improved ELM and DBSCAN Algorithm

Author(s): (Ph.D. Student, School of Electrical Engineering, Wuhan Univ., Wuhan, Hubei 430072, China.)
(Director, School of Electrical Engineering, Wuhan Univ., Wuhan, Hubei 430072, China (corresponding author).)
(Professor, School of Electrical Engineering, Wuhan Univ., Wuhan, Hubei 430072, China.)
(Ph.D. Student, School of Electrical Engineering, Wuhan Univ., Wuhan, Hubei 430072, China.)
(Postdoctoral Fellowship, School of Electrical Engineering, Wuhan Univ., Wuhan, Hubei 430072, China.)
(Ph.D. Student, School of Electrical Engineering, Wuhan Univ., Wuhan, Hubei 430072, China.)
(Director, School of Electrical Engineering, Wuhan Univ., Wuhan, Hubei 430072, China.)
Medium: journal article
Language(s): English
Published in: Journal of Energy Engineering, , n. 3, v. 144
Page(s): 04018026
DOI: 10.1061/(asce)ey.1943-7897.0000544
Structurae cannot make the full text of this publication available at this time. The full text can be accessed through the publisher via the DOI: 10.1061/(asce)ey.1943-7897.0000544.
  • About this
    data sheet
  • Reference-ID
    10588623
  • Published on:
    08/03/2021
  • Last updated on:
    08/03/2021
 
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