Optimizing Rolling Patterns for Chip Seals Using Laboratory Aggregate Loss Performance Tests on Field Fabricated Samples
Author(s): |
Jaejun Lee
Y. Richard Kim |
---|---|
Medium: | journal article |
Language(s): | English |
Published in: | Journal of Performance of Constructed Facilities (ASCE), June 2010, n. 3, v. 24 |
Page(s): | 249-257 |
DOI: | 10.1061/(asce)cf.1943-5509.0000096 |
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10199507 - Published on:
01/12/2018 - Last updated on:
01/12/2018