A method for quantitatively evaluating the impact of defects on wall U-value using infrared thermal imaging
Author(s): |
Shu Zheng
Fulin Hao Youcun Lu Tingting Jiang Xudong Yang |
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Medium: | journal article |
Language(s): | English |
Published in: | Building Simulation |
DOI: | 10.1007/s12273-024-1213-7 |
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data sheet - Reference-ID
10816699 - Published on:
03/02/2025 - Last updated on:
03/02/2025