In situcharacterization of NiTi based shape memory thin films by optical measurement
| Author(s): |
M. J. Wu
W. M. Huang F. Chollet |
|---|---|
| Medium: | journal article |
| Language(s): | English |
| Published in: | Smart Materials and Structures, April 2006, n. 2, v. 15 |
| Page(s): | N29-N35 |
| DOI: | 10.1088/0964-1726/15/2/n01 |
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10223046 - Published on:
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04/12/2018
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