An IGBT coupling structure with a smart service life reliability predictor using active learning
Author(s): |
Shizhe Feng
Yicheng Guo Weihua Li Haiping Du Grzegorz Królczyk Z. Li |
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Medium: | journal article |
Language(s): | English |
Published in: | Smart Materials and Structures, 18 September 2024, n. 10, v. 33 |
Page(s): | 105029 |
DOI: | 10.1088/1361-665x/ad7659 |
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10798892 - Published on:
23/09/2024 - Last updated on:
23/09/2024