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A guided Bayesian inference approach for detection of multiple flaws in structures using the extended finite element method

Author(s):


Medium: journal article
Language(s): English
Published in: Computers & Structures, , v. 152
Page(s): 27-44
DOI: 10.1016/j.compstruc.2015.02.010
Structurae cannot make the full text of this publication available at this time. The full text can be accessed through the publisher via the DOI: 10.1016/j.compstruc.2015.02.010.
  • About this
    data sheet
  • Reference-ID
    10284592
  • Published on:
    05/01/2019
  • Last updated on:
    05/01/2019
 
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