Detection of crack propagation in Si3N4/Si3N4-TiN laminated ceramics by electrical resistance
Author(s): |
B. Zhang
J. B. Li Y. Deng Z. D. Guan |
---|---|
Medium: | journal article |
Language(s): | English |
Published in: | Smart Materials and Structures, August 2001, n. 4, v. 10 |
Page(s): | 846-849 |
DOI: | 10.1088/0964-1726/10/4/402 |
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10215559 - Published on:
04/12/2018 - Last updated on:
04/12/2018