Data-driven approach for a one-dimensional thin-walled beam analysis
Author(s): |
Dongil Shin
Yoon Young Kim |
---|---|
Medium: | journal article |
Language(s): | English |
Published in: | Computers & Structures, April 2020, v. 231 |
Page(s): | 106207 |
DOI: | 10.1016/j.compstruc.2020.106207 |
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10410745 - Published on:
05/02/2020 - Last updated on:
05/02/2020