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Charging/discharging of silicon nanocrystals embedded in an SiO2 matrix inducing reduction/recovery in the total capacitance and tunneling current

This publication lists 9 references to other publication(s):

  • About this
    data sheet
  • Reference-ID
    10222986
  • Published on:
    04/12/2018
  • Last updated on:
    04/12/2018
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