Charging/discharging of silicon nanocrystals embedded in an SiO2 matrix inducing reduction/recovery in the total capacitance and tunneling current
| Author(s): |
C. Y. Ng
Y. Liu T. P. Chen M. S. Tse |
|---|---|
| Medium: | journal article |
| Language(s): | English |
| Published in: | Smart Materials and Structures, February 2006, n. 1, v. 15 |
| Page(s): | S43-S46 |
| DOI: | 10.1088/0964-1726/15/1/008 |
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10222986 - Published on:
04/12/2018 - Last updated on:
04/12/2018
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