Characterization of sputtering deposited NiTi shape memory thin films using a temperature controllable atomic force microscope
| Author(s): |
Q. He
W. M. Huang M. H. Hong M. J. Wu Y. Q. Fu T. C. Chong F. Chellet H. J. Du |
|---|---|
| Medium: | journal article |
| Language(s): | English |
| Published in: | Smart Materials and Structures, October 2004, n. 5, v. 13 |
| Page(s): | 977-982 |
| DOI: | 10.1088/0964-1726/13/5/001 |
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10223217 - Published on:
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04/12/2018
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