Bayesian Network for E/M Impedance-Based Damage Identification
Author(s): |
A. S. Naidu
C. K. Soh K. V. Pagalthivarthi |
---|---|
Medium: | journal article |
Language(s): | English |
Published in: | Journal of Computing in Civil Engineering, July 2006, n. 4, v. 20 |
Page(s): | 227-236 |
DOI: | 10.1061/(asce)0887-3801(2006)20:4(227) |
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10259861 - Published on:
29/12/2018 - Last updated on:
29/12/2018