Accurate measurement of the piezoelectric coefficient of thin films by eliminating the substrate bending effect using spatial scanning laser vibrometry
Author(s): |
Glenn J. T. Leighton
Zhaorong Huang |
---|---|
Medium: | journal article |
Language(s): | English |
Published in: | Smart Materials and Structures, June 2010, n. 6, v. 19 |
Page(s): | 065011 |
DOI: | 10.1088/0964-1726/19/6/065011 |
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10224194 - Published on:
04/12/2018 - Last updated on:
04/12/2018