Amit Lal
- Fabrication and electromechanical characterization of silicon on insulator based electrostatic micro-scanners. In: Smart Materials and Structures, v. 14, n. 4 (August 2005). (2005):
- The squeeze film damping effect of perforated microscanners: modeling and characterization. In: Smart Materials and Structures, v. 15, n. 2 (April 2006). (2006):