Amit Lal
- (2005): Fabrication and electromechanical characterization of silicon on insulator based electrostatic micro-scanners. In: Smart Materials and Structures, v. 14, n. 4 (August 2005).
- (2006): The squeeze film damping effect of perforated microscanners: modeling and characterization. In: Smart Materials and Structures, v. 15, n. 2 (April 2006).
Structurae kooperiert mit
