Thickness mode EMIS of constrained proof-mass piezoelectric wafer active sensors
| Author(s): |
Tuncay Kamas
Victor Giurgiutiu Bin Lin |
|---|---|
| Medium: | journal article |
| Language(s): | English |
| Published in: | Smart Materials and Structures, November 2015, n. 11, v. 24 |
| Page(s): | 115035 |
| DOI: | 10.1088/0964-1726/24/11/115035 |
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10226050 - Published on:
04/12/2018 - Last updated on:
04/12/2018
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