Pseudo-dynamic testing using conventional testing devices
Author(s): |
Masayoshi Nakashima
Takashi Akazawa Hideichi Igarashi |
---|---|
Medium: | journal article |
Language(s): | English |
Published in: | Earthquake Engineering and Structural Dynamics, October 1995, n. 10, v. 24 |
Page(s): | 1409-1422 |
DOI: | 10.1002/eqe.4290241009 |
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07/12/2018