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Numerical modelling on dispersion behavior of particulate contamination induced by a moving operator in a semiconductor cleanroom: A eulerian-eulerian method

Author(s):



Medium: journal article
Language(s): English
Published in: Journal of Building Engineering, , v. 96
Page(s): 110409
DOI: 10.1016/j.jobe.2024.110409
Structurae cannot make the full text of this publication available at this time. The full text can be accessed through the publisher via the DOI: 10.1016/j.jobe.2024.110409.
  • About this
    data sheet
  • Reference-ID
    10792745
  • Published on:
    01/09/2024
  • Last updated on:
    01/09/2024
 
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