The LCPC BOX: a cheap and simple technique for yield stress measurements of SCC
Author(s): |
Nicolas Roussel
|
---|---|
Medium: | journal article |
Language(s): | English |
Published in: | Materials and Structures, November 2007, n. 9, v. 40 |
Page(s): | 889-896 |
DOI: | 10.1617/s11527-007-9230-4 |
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data sheet - Reference-ID
10151275 - Published on:
10/12/2018 - Last updated on:
10/12/2018