Characterization of CRM Binders with Wax Additives Using an Atomic Force Microscopy (AFM) and an Optical Microscopy
Author(s): |
Hyun Hwan Kim
Mithil Mazumder Anthony Torres Soon-Jae Lee Moon-Sup Lee |
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Medium: | journal article |
Language(s): | English |
Published in: | Advances in Civil Engineering Materials, December 2017, n. 1, v. 6 |
Page(s): | 20160071 |
DOI: | 10.1520/acem20160071 |
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10330381 - Published on:
27/07/2019 - Last updated on:
27/07/2019