Capacitance-based defect detection and defect location determination for cement-based material
Author(s): |
Yulin Wang
D. D. L. Chung |
---|---|
Medium: | journal article |
Language(s): | English |
Published in: | Materials and Structures, December 2017, n. 6, v. 50 |
DOI: | 10.1617/s11527-017-1094-7 |
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10151340 - Published on:
11/12/2018 - Last updated on:
11/12/2018