Assessing the Information Content of a Non-Destructive Testing CMOS Imaging Detector
Author(s): |
Dionysios Linardatos
Vaia Koukou Niki Martini Anastasios Konstantinidis Athanasios Bakas George Fountos Ioannis Valais Christos Michail |
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Medium: | journal article |
Language(s): | English |
Published in: | Procedia Structural Integrity, 2021, v. 33 |
Page(s): | 304-311 |
DOI: | 10.1016/j.prostr.2021.10.037 |
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10645654 - Published on:
10/01/2022 - Last updated on:
10/01/2022