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The following bibliography contains all publications indexed in this database that are linked with this name as either author, editor or any other kind of contributor.

  1. Yang, Ge / Wang, Zhongda / Kang, Sung-Mo (2006): Gate leakage tolerant circuits in deep sub-100 nm CMOS technologies. In: Smart Materials and Structures, v. 15, n. 1 (February 2006).

    https://doi.org/10.1088/0964-1726/15/1/005

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