Yoshikazu Hirai
- Tensile fracture of integrated single-crystal silicon nanowire using MEMS electrostatic testing device. In: Procedia Structural Integrity, v. 2 ( 2016). (2016):
- Effect of Crystallographic Orientations on Fractures and Slip Occurrences at 500 °C of (110) Single Crystal Silicon Microstructures. In: Procedia Structural Integrity, v. 2 ( 2016). (2016):