Author(s): |
Hans Seelhofer
Thomas Ekwall |
---|---|
Medium: | journal article |
Language(s): | German |
Published in: | TEC21, 8 December 2017, n. 49-50, v. 143 |
DOI: | 10.5169/seals-737439 |
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10501121 - Published on:
24/11/2020 - Last updated on:
24/11/2020