A new Fourier-related double scale analysis for wrinkling analysis of thin films on compliant substrates
| Author(s): |
Qun Huang
Jie Yang Wei Huang Yin Liu Heng Hu Gaetano Giunta Salim Belouettar |
|---|---|
| Medium: | journal article |
| Language(s): | English |
| Published in: | Composite Structures, January 2017, v. 160 |
| Page(s): | 613-624 |
| DOI: | 10.1016/j.compstruct.2016.10.062 |
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23/10/2020
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