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Lifetime prediction using accelerated test data and neural networks

Author(s):



Medium: journal article
Language(s): English
Published in: Computers & Structures, , n. 19-20, v. 87
Page(s): 1187-1194
DOI: 10.1016/j.compstruc.2008.12.007
Structurae cannot make the full text of this publication available at this time. The full text can be accessed through the publisher via the DOI: 10.1016/j.compstruc.2008.12.007.
  • About this
    data sheet
  • Reference-ID
    10282433
  • Published on:
    05/01/2019
  • Last updated on:
    05/01/2019
 
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