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Generalized method for identifying yield-line patterns in T-stubs using discontinuity layout optimization

Author(s):
Medium: journal article
Language(s): English
Published in: Engineering Structures, , v. 244
Page(s): 112802
DOI: 10.1016/j.engstruct.2021.112802
Structurae cannot make the full text of this publication available at this time. The full text can be accessed through the publisher via the DOI: 10.1016/j.engstruct.2021.112802.
  • About this
    data sheet
  • Reference-ID
    10623861
  • Published on:
    26/08/2021
  • Last updated on:
    26/08/2021
 
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