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First-Principles Analysis of Deformation and Fracture Properties of Semiconductors

Author(s):

Medium: journal article
Language(s): English
Published in: Procedia Structural Integrity, , v. 23
Page(s): 372-377
DOI: 10.1016/j.prostr.2020.01.115
Structurae cannot make the full text of this publication available at this time. The full text can be accessed through the publisher via the DOI: 10.1016/j.prostr.2020.01.115.
  • About this
    data sheet
  • Reference-ID
    10644680
  • Published on:
    10/01/2022
  • Last updated on:
    10/01/2022
 
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