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D. J. Pete

The following bibliography contains all publications indexed in this database that are linked with this name as either author, editor or any other kind of contributor.

  1. Pete, D. J. / Mhaisalkar, S. G. / Helonde, J. B. / Vairagar, A. V. (2012): Electromigration-induced void evolution in upper and lower layer dual-inlaid Copper interconnect structures. In: Advances in Materials Research, v. 1, n. 2 (June 2012).

    https://doi.org/10.12989/amr.2012.1.2.109

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