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Byeongdo Lee

The following bibliography contains all publications indexed in this database that are linked with this name as either author, editor or any other kind of contributor.

  1. Kim, Taewan / Yoon, Youngjoon / Lee, Byeongdo / Ham, Namhyuk / Kim, Jae-Jun (2022): Cost–Benefit Analysis of Scan-vs-BIM-Based Quality Management. In: Buildings, v. 12, n. 12 (1 December 2022).

    https://doi.org/10.3390/buildings12122052

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