A non-local based microcrack segmentation model optimized for effective high resolution and low-power devices
Auteur(s): |
Kyung-Su Kang
JoonOh Seo Han-Guk Ryu |
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Médium: | article de revue |
Langue(s): | anglais |
Publié dans: | Journal of Building Engineering, novembre 2024, v. 96 |
Page(s): | 110650 |
DOI: | 10.1016/j.jobe.2024.110650 |
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10817851 - Publié(e) le:
03.02.2025 - Modifié(e) le:
03.02.2025