Full-Lane Coverage Micromilling Pavement-Surface Quality Control Using Emerging 3D Line Laser Imaging Technology
Auteur(s): |
Yichang Tsai
(Associate Professor, School of Civil and Environmental Engineering, Georgia Institute of Technology, 790 Atlantic Dr., Atlanta, GA 30032; and Changjiang Scholar, Chang’an Univ., Xi’an, China.)
Yiching Wu (Research Engineer, School of Civil and Environmental Engineering, Georgia Institute of Technology, 790 Atlantic Dr., Atlanta, GA 30032 (corresponding author).) Zachary Lewis (Graudate Student, School of Civil and Environmental Engineering, Georgia Institute of Technology, 790 Atlantic Dr., Atlanta, GA 30032.) |
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Médium: | article de revue |
Langue(s): | anglais |
Publié dans: | Journal of Transportation Engineering, février 2014, n. 2, v. 140 |
Page(s): | 04013006 |
DOI: | 10.1061/(asce)te.1943-5436.0000604 |
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10635632 - Publié(e) le:
29.11.2021 - Modifié(e) le:
29.11.2021