Determining influence of impressed current density on current efficiency with X-ray micro-computed tomography
Auteur(s): |
Shuxian Hong
Fan Zheng Guiyun Shi Biqin Dong Min Liu Luping Tang Yuxin Zhang |
---|---|
Médium: | article de revue |
Langue(s): | anglais |
Publié dans: | Construction and Building Materials, juin 2020, v. 246 |
Page(s): | 118505 |
DOI: | 10.1016/j.conbuildmat.2020.118505 |
- Informations
sur cette fiche - Reference-ID
10414663 - Publié(e) le:
26.02.2020 - Modifié(e) le:
26.02.2020