Deep levels model identification in semiconductor barrier structures
| Auteur(s): |
Vladimir Krylov
Konstantin Tatmyshevskiy Aleksey Bogachev |
|---|---|
| Médium: | article de revue |
| Langue(s): | anglais |
| Publié dans: | IOP Conference Series: Materials Science and Engineering, août 2020, v. 896 |
| Conférence: | International Conference on Materials Physics, Building Structures and Technologies in Construction, Industrial and Production Engineering (MPCPE 2020) 27-28 April 2020, Vladimir State University named after Alexander and Nikolay Stoletovs, Vladimir, Russ |
| Page(s): | 012125 |
| DOI: | 10.1088/1757-899X/896/1/012125 |
- Informations
sur cette fiche - Reference-ID
10431274 - Publié(e) le:
25.08.2020 - Modifié(e) le:
25.08.2020
Structurae coopère avec
