Comparison of Fundamental Frequency and Sweep Resistance of Different Wire Loops Using Finite Element Model

Wire loop resistance is critical for microelectronic packaging because it directly influences the reliability of the product. Proposed herein is an effective method for predicting the resistance of a wire loop. A finite element (FE) model is developed for verifying the method. The wire geometry is modeled based on actual wire profiles captured with a high-speed camera. Based on this model, the effects of wire properties, residual stresses, loop shape and loop type on the wire loop resistance are studied. Simulations demonstrated that the shape of the loop could dramatically alter the wire loop resistance. On the other hand, the wire properties, residual stresses and loop type mildly affect the wire loop resistance. The standard loop is the more resistant loop than the N and M loops. By using a large and hard wire, moderately tensioning the wire loop and reducing the loop span, height and number of kinks, one can improve the wire loop resistance. This study should provide useful insights into loop design for modern microelectronic packaging.